Invention Grant
- Patent Title: Interconnect structure, electronic device including the same, and method of manufacturing interconnect structure
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Application No.: US17545468Application Date: 2021-12-08
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Publication No.: US12341063B2Publication Date: 2025-06-24
- Inventor: Keunwook Shin , Minsu Seol , Sangwon Kim , Kyung-Eun Byun , Hyeonjin Shin
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: HARNESS, DICKEY & PIERCE, P.L.C.
- Priority: KR10-2021-0076233 20210611
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L23/532

Abstract:
Disclosed are an interconnect structure, an electronic device including the same, and a method of manufacturing the interconnect structure. The interconnect structure includes a dielectric layer; a conductive interconnect on the dielectric layer; and a graphene cap layer on the conductive interconnect. The graphene cap layer contains graphene quantum dots, has a carbon content of 80 at % or more, and has an oxygen content of 15 at % or less.
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