- Patent Title: Method and device for configuration of minimization of drive tests
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Application No.: US17927156Application Date: 2021-05-21
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Publication No.: US12342206B2Publication Date: 2025-06-24
- Inventor: Hong Wang , Lixiang Xu , Weiwei Wang
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: The Farrell Law Firm, P.C.
- Priority: CN202010444297.6 20200522,CN202010463671.7 20200527,CN202010777826.4 20200805,CN202011535071.3 20201222
- International Application: PCT/KR2021/006333 WO 20210521
- International Announcement: WO2021/235886 WO 20211125
- Main IPC: H04W24/10
- IPC: H04W24/10
Abstract:
The present disclosure provides a method and device for configuration of minimization of drive tests, in which a first node sends MDT status information to a second node; and the second node decides whether it is possible to configure a management-based logged MDT measurement for a UE. It is avoided that the MDT configuration information that is currently still valid is erroneously overwritten when the network reconfigures the MDT for the UE.
Public/Granted literature
- US20230199541A1 METHOD AND DEVICE FOR CONFIGURATION OF MINIMIZATION OF DRIVE TESTS Public/Granted day:2023-06-22
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