Invention Publication
- Patent Title: METHOD AND DEVICE FOR CONFIGURATION OF MINIMIZATION OF DRIVE TESTS
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Application No.: US17927156Application Date: 2021-05-21
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Publication No.: US20230199541A1Publication Date: 2023-06-22
- Inventor: Hong WANG , Lixiang XU , Weiwei WANG
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Priority: CN 2010444297.6 2020.05.22 CN 2010463671.7 2020.05.27 CN 2010777826.4 2020.08.05 CN 2011535071.3 2020.12.22
- International Application: PCT/KR2021/006333 2021.05.21
- Date entered country: 2022-11-22
- Main IPC: H04W24/10
- IPC: H04W24/10

Abstract:
The present disclosure provides a method and device for configuration of minimization of drive tests, in which a first node sends MDT status information to a second node; and the second node decides whether it is possible to configure a management-based logged MDT measurement for a UE. It is avoided that the MDT configuration information that is currently still valid is erroneously overwritten when the network reconfigures the MDT for the UE.
Public/Granted literature
- US12342206B2 Method and device for configuration of minimization of drive tests Public/Granted day:2025-06-24
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