Invention Application
- Patent Title: Optical spectrum analyzer
- Patent Title (中): 光谱分析仪
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Application No.: US09753673Application Date: 2001-01-04
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Publication No.: US20010030745A1Publication Date: 2001-10-18
- Inventor: Gang He , Daniel Gariepy , Gregory Walter Schinn
- Applicant: EXFO Electro-Optical Engineering Inc.
- Applicant Address: null
- Assignee: EXFO Electro-Optical Engineering Inc.
- Current Assignee: EXFO Electro-Optical Engineering Inc.
- Current Assignee Address: null
- Main IPC: G01J003/28
- IPC: G01J003/28

Abstract:
An optical spectrum analyzer comprises a diffraction grating (DG), a polarization decomposing unit (PDM) for decomposing the input light beam into first and second light beams having mutually-perpendicular linear states of polarization, and two output ports (FP2/1, FP2/2) each for receiving from the grating, substantially exclusively, a respective one of the polarized light beams (LT, LR) after diffraction by the diffraction grating (DG). Each of the linearly-polarized light beams is directed onto the diffraction grating with its linear state of polarization at any prescribed angle to a corresponding plane of diffraction of the diffraction grating The arrangement is such that the state of polarization of the light beams, at any particular wavelength within an operating band of the analyzer remains substantially unchanged with respect to time, The analyzer also may have a reflector (RAM) for reflecting the light beams leaving the diffraction grating after diffraction a first time so as to return them to the diffraction grating for diffraction a second time.
Public/Granted literature
- US06636306B2 Optical spectrum analyzer Public/Granted day:2003-10-21
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