Invention Application
US20070258001A1 Method for Producing High Signal to Noise Spectral Measurements in Optical Dectector Arrays 审中-公开
用于在光学探测器阵列中产生高信噪比光谱测量的方法

  • Patent Title: Method for Producing High Signal to Noise Spectral Measurements in Optical Dectector Arrays
  • Patent Title (中): 用于在光学探测器阵列中产生高信噪比光谱测量的方法
  • Application No.: US10587579
    Application Date: 2005-01-31
  • Publication No.: US20070258001A1
    Publication Date: 2007-11-08
  • Inventor: Alexei StancoAizengendler Mark
  • Applicant: Alexei StancoAizengendler Mark
  • Priority: AU2004900428 20040130
  • International Application: PCT/AU05/00118 WO 20050131
  • Main IPC: H04N5/335
  • IPC: H04N5/335
Method for Producing High Signal to Noise Spectral Measurements in Optical Dectector Arrays
Abstract:
The present invention relates to a method and apparatus for producing high signal to noise spectral measurements in optical detector arrays and in particular to uncooled linear CCD arrays. This is accomplished by providing a detector and a database of dark signal readings unique to that detector that is generally created at the time of manufacture and that can then be used to provide a value for the dark signal inherent to that detector that can be used to correct the measured signal. The detector also includes a means to measure its temperature so that the appropriate dark signal value can be subtracted from the measured signal. This is because the dark signal is a function of both the temperature and the exposure time.
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