Invention Application
US20120039438A1 SYSTEMS AND METHODS FOR DETECTING AN IMAGE OF AN OBJECT USING MULTI-BEAM IMAGING FROM AN X-RAY BEAM HAVING A POLYCHROMATIC DISTRIBUTION
有权
用于利用具有多色分布的X射线光束来检测使用多光束成像的对象的图像的系统和方法
- Patent Title: SYSTEMS AND METHODS FOR DETECTING AN IMAGE OF AN OBJECT USING MULTI-BEAM IMAGING FROM AN X-RAY BEAM HAVING A POLYCHROMATIC DISTRIBUTION
- Patent Title (中): 用于利用具有多色分布的X射线光束来检测使用多光束成像的对象的图像的系统和方法
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Application No.: US13132205Application Date: 2009-12-01
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Publication No.: US20120039438A1Publication Date: 2012-02-16
- Inventor: Christopher Parham , Zhong Zhong , Etta Pisano , Dean M. Connor, JR.
- Applicant: Christopher Parham , Zhong Zhong , Etta Pisano , Dean M. Connor, JR.
- Applicant Address: US NC Chapel Hill US NJ Chapel Hill US NY Upton
- Assignee: THE UNIVERSITY OF NORTH CAROLOINA AT CHAPEL HILL,NEXTRAY, INC.,BROOKHAVEN SCIENCE ASSOCIATES
- Current Assignee: THE UNIVERSITY OF NORTH CAROLOINA AT CHAPEL HILL,NEXTRAY, INC.,BROOKHAVEN SCIENCE ASSOCIATES
- Current Assignee Address: US NC Chapel Hill US NJ Chapel Hill US NY Upton
- International Application: PCT/US2009/066239 WO 20091201
- Main IPC: G01N23/087
- IPC: G01N23/087

Abstract:
Systems and methods for detecting an image of an object using a multi-beam imaging system from an x-ray beam having a polychromatic energy distribution are disclosed. According to one aspect, a method can include generating a first X-ray beam having a polychromatic energy distribution. Further, the method can include positioning a plurality of monochromator crystals in a predetermined position to directly intercept the first X-ray beam such that a plurality of second X-ray beams having predetermined energy levels are produced. Further, an object can be positioned in the path of the second X-ray beams for transmission of the second X-ray beams through the object and emission from the object as transmitted X-ray beams. The transmitted X-ray beams can each be directed at an angle of incidence upon one or more crystal analyzers. Further, an image of the object can be detected from the beams diffracted from the analyzer crystals.
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