公开(公告)号：US20070291896A1

公开(公告)日：2007-12-20

申请号：US11657391

申请日：2007-01-24

Applicant: Christopher Parham ,  Zhong Zhong ,  Etta Pisano ,  Dean Connor ,  Leroy Chapman

Inventor： Christopher Parham ,  Zhong Zhong ,  Etta Pisano ,  Dean Connor ,  Leroy Chapman

IPC: G01N23/04 ,  A61B6/12

CPC classification number: G01N23/046 ,  A61B6/508 ,  A61B6/583 ,  G01N2223/419

Abstract: Systems and methods for detecting an image of an object using an X-ray beam having a polychromatic energy distribution are disclosed. According to one aspect, a method can include detecting an image of an object. The method can include generating a first X-ray beam having a polychromatic energy distribution. Further, the method can include positioning a single monochromator crystal in a predetermined position to directly intercept the first X-ray beam such that a second X-ray beam having a predetermined energy level is produced. Further, an object can be positioned in the path of the second X-ray beam for transmission of the second X-ray beam through the object and emission from the object as a transmitted X-ray beam. The transmitted X-ray beam can be directed at an angle of incidence upon a crystal analyzer. Further, an image of the object can be detected from a beam diffracted from the analyzer crystal.

Abstract translation: 公开了使用具有多色能量分布的X射线束检测物体的图像的系统和方法。 根据一个方面，一种方法可以包括检测对象的图像。 该方法可以包括产生具有多色能量分布的第一X射线束。 此外，该方法可以包括将单个单色器晶体定位在预定位置以直接截取第一X射线束，使得产生具有预定能级的第二X射线束。 此外，物体可以位于第二X射线束的路径中，用于通过物体传输第二X射线束并将其作为透射的X射线束从物体发射。 透射的X射线束可以以一个入射角指向晶体分析仪。 此外，可以从分析器晶体衍射的光束检测物体的图像。

公开(公告)号：US20100310047A1

公开(公告)日：2010-12-09

申请号：US12793228

申请日：2010-06-03

Applicant: Dean Connor ,  Zhong Zhong ,  Christopher Parham ,  Etta Pisano

Inventor： Dean Connor ,  Zhong Zhong ,  Christopher Parham ,  Etta Pisano

IPC: G21K1/06

CPC classification number: A61B6/032 ,  A61B6/06 ,  A61B6/4035 ,  A61B6/4208 ,  A61B6/482 ,  A61B6/483 ,  A61B6/502 ,  A61B6/542 ,  G21K1/06 ,  G21K2201/062 ,  G21K2207/005 ,  H01J2235/068 ,  H01J2235/08

Abstract: Strain matching of crystals and horizontally-spaced monochromator and analyzer crystal arrays in diffraction enhanced imaging systems and related methods are disclosed. A DEI system, including strain matched crystals can comprise an X-ray source configured to generate a first X-ray beam. A first monochromator crystal can be positioned to intercept the first X-ray beam for producing a second X-ray beam. A second monochromator crystal can be positioned to intercept the second X-ray beam to produce a third X-ray beam for transmission through an object. The second monochromator crystal has a thickness selected such that a mechanical strain on a side of the first monochromator crystal is the same as a mechanical strain on the second monochromator crystal. An analyzer crystal has a thickness selected such that a mechanical strain on a side of the first monochromator crystal is the same as a mechanical strain on the analyzer crystal.

Abstract translation: 公开了晶体和水平间隔单色仪和分析器晶体阵列在衍射增强成像系统中的应变匹配和相关方法。 包括应变匹配晶体的DEI系统可以包括被配置为产生第一X射线束的X射线源。 可以将第一单色仪晶体定位成截取第一X射线束以产生第二X射线束。 第二单色器晶体可以被定位成截取第二X射线束以产生用于透过物体的第三X射线束。 第二单色器晶体具有选择的厚度，使得第一单色仪晶体侧的机械应变与第二单色仪晶体上的机械应变相同。 分析器晶体的厚度被选择为使得第一单色仪晶体侧的机械应变与分析器晶体上的机械应变相同。

公开(公告)号：US07742564B2

公开(公告)日：2010-06-22

申请号：US11657391

申请日：2007-01-24

Applicant: Christopher Parham ,  Zhong Zhong ,  Etta Pisano ,  Dean Connor ,  Leroy D. Chapman

Inventor： Christopher Parham ,  Zhong Zhong ,  Etta Pisano ,  Dean Connor ,  Leroy D. Chapman

IPC: G01N23/20 ,  G01N23/201 ,  G01N23/207

CPC classification number: G01N23/046 ,  A61B6/508 ,  A61B6/583 ,  G01N2223/419

Abstract: Systems and methods for detecting an image of an object using an X-ray beam having a polychromatic energy distribution are disclosed. According to one aspect, a method can include detecting an image of an object. The method can include generating a first X-ray beam having a polychromatic energy distribution. Further, the method can include positioning a single monochromator crystal in a predetermined position to directly intercept the first X-ray beam such that a second X-ray beam having a predetermined energy level is produced. Further, an object can be positioned in the path of the second X-ray beam for transmission of the second X-ray beam through the object and emission from the object as a transmitted X-ray beam. The transmitted X-ray beam can be directed at an angle of incidence upon a crystal analyzer. Further, an image of the object can be detected from a beam diffracted from the analyzer crystal.

Abstract translation: 公开了使用具有多色能量分布的X射线束检测物体的图像的系统和方法。 根据一个方面，一种方法可以包括检测对象的图像。 该方法可以包括产生具有多色能量分布的第一X射线束。 此外，该方法可以包括将单个单色器晶体定位在预定位置以直接截取第一X射线束，使得产生具有预定能级的第二X射线束。 此外，物体可以位于第二X射线束的路径中，用于通过物体传输第二X射线束并将其作为透射的X射线束从物体发射。 透射的X射线束可以以一个入射角指向晶体分析仪。 此外，可以从分析器晶体衍射的光束检测物体的图像。

公开(公告)号：US08204174B2

公开(公告)日：2012-06-19

申请号：US12708579

申请日：2010-02-19

Applicant: Dean Connor ,  Christopher Parham ,  Etta Pisano ,  Waldo S. Hinshaw ,  Zhong Zhong ,  Brian P. Wilfley

Inventor： Dean Connor ,  Christopher Parham ,  Etta Pisano ,  Waldo S. Hinshaw ,  Zhong Zhong ,  Brian P. Wilfley

IPC: G01N23/087 ,  G01N23/20 ,  G01N23/207 ,  G21K1/06

CPC classification number: A61B6/4035 ,  A61B6/032 ,  A61B6/06 ,  A61B6/482 ,  A61B6/502 ,  A61B6/5282 ,  A61B6/542 ,  G21K2201/062 ,  G21K2207/005 ,  H01J2235/068 ,  H01J2235/08

Abstract: Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources are disclosed. A plurality of monochromator crystals may be positioned to intercept the plurality of first X-ray beams such that a plurality of second X-ray beams each having predetermined energy levels is produced. Further, an object to be imaged may be positioned in paths of the second x-ray beams for transmission of the second X-ray beams through the object and emitting from the object a plurality of transmission X-ray beams. The X-ray beams may be directed at angles of incidence upon a plurality of analyzer crystals for detecting an image of the object.

Abstract translation: 公开了通过使用由多个小区域源产生的X射线束来检测物体的图像的系统和方法。 可以将多个单色器晶体定位成截取多个第一X射线束，使得产生多个具有预定能级的第二X射线束。 此外，要成像的物体可以位于第二X射线束的路径中，用于透过物体传输第二X射线束，并从物体发射多个透射X射线束。 X射线束可以以多个分析器晶体的入射角定向，以检测物体的图像。

公开(公告)号：US08315358B2

公开(公告)日：2012-11-20

申请号：US12793228

申请日：2010-06-03

Applicant: Dean Connor ,  Zhong Zhong ,  Christopher Parham ,  Etta Pisano

Inventor： Dean Connor ,  Zhong Zhong ,  Christopher Parham ,  Etta Pisano

IPC: G21K1/06

CPC classification number: A61B6/032 ,  A61B6/06 ,  A61B6/4035 ,  A61B6/4208 ,  A61B6/482 ,  A61B6/483 ,  A61B6/502 ,  A61B6/542 ,  G21K1/06 ,  G21K2201/062 ,  G21K2207/005 ,  H01J2235/068 ,  H01J2235/08

Abstract: Strain matching of crystals and horizontally-spaced monochromator and analyzer crystal arrays in diffraction enhanced imaging systems and related methods are disclosed. A DEI system, including strain matched crystals can comprise an X-ray source configured to generate a first X-ray beam. A first monochromator crystal can be positioned to intercept the first X-ray beam for producing a second X-ray beam. A second monochromator crystal can be positioned to intercept the second X-ray beam to produce a third X-ray beam for transmission through an object. The second monochromator crystal has a thickness selected such that a mechanical strain on a side of the first monochromator crystal is the same as a mechanical strain on the second monochromator crystal. An analyzer crystal has a thickness selected such that a mechanical strain on a side of the first monochromator crystal is the same as a mechanical strain on the analyzer crystal.

Abstract translation: 公开了晶体和水平间隔单色仪和分析器晶体阵列在衍射增强成像系统和相关方法中的应变匹配。 包括应变匹配晶体的DEI系统可以包括被配置为产生第一X射线束的X射线源。 可以将第一单色仪晶体定位成截取第一X射线束以产生第二X射线束。 第二单色器晶体可以被定位成截取第二X射线束以产生用于透过物体的第三X射线束。 第二单色器晶体具有选择的厚度，使得第一单色仪晶体侧的机械应变与第二单色仪晶体上的机械应变相同。 分析器晶体的厚度被选择为使得第一单色仪晶体侧的机械应变与分析器晶体上的机械应变相同。

公开(公告)号：US20100310046A1

公开(公告)日：2010-12-09

申请号：US12708579

申请日：2010-02-19

Applicant: Dean Connor ,  Christopher Parham ,  Etta Pisano ,  Waldo S. Hinshaw ,  Zhong Zhong ,  Brian P. Wilfley

Inventor： Dean Connor ,  Christopher Parham ,  Etta Pisano ,  Waldo S. Hinshaw ,  Zhong Zhong ,  Brian P. Wilfley

IPC: G21K1/06

CPC classification number: A61B6/4035 ,  A61B6/032 ,  A61B6/06 ,  A61B6/482 ,  A61B6/502 ,  A61B6/5282 ,  A61B6/542 ,  G21K2201/062 ,  G21K2207/005 ,  H01J2235/068 ,  H01J2235/08

Abstract: Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources are disclosed. A plurality of monochromator crystals may be positioned to intercept the plurality of first X-ray beams such that a plurality of second X-ray beams each having predetermined energy levels is produced. Further, an object to be imaged may be positioned in paths of the second x-ray beams for transmission of the second X-ray beams through the object and emitting from the object a plurality of transmission X-ray beams. The X-ray beams may be directed at angles of incidence upon a plurality of analyzer crystals for detecting an image of the object.

Abstract translation: 公开了通过使用由多个小区域源产生的X射线束来检测物体的图像的系统和方法。 可以将多个单色器晶体定位成截取多个第一X射线束，使得产生多个具有预定能级的第二X射线束。 此外，要成像的物体可以位于第二X射线束的路径中，用于透过物体传输第二X射线束，并从物体发射多个透射X射线束。 X射线束可以以多个分析器晶体的入射角定向，以检测物体的图像。

公开(公告)号：US20120039438A1

公开(公告)日：2012-02-16

申请号：US13132205

申请日：2009-12-01

Applicant: Christopher Parham ,  Zhong Zhong ,  Etta Pisano ,  Dean M. Connor, JR.

Inventor： Christopher Parham ,  Zhong Zhong ,  Etta Pisano ,  Dean M. Connor, JR.

IPC: G01N23/087

CPC classification number: A61B6/4092 ,  A61B6/032 ,  A61B6/4021 ,  A61B6/4035 ,  A61B6/4042 ,  A61B6/4488 ,  A61B6/482 ,  A61B6/502 ,  A61B6/5282 ,  A61B6/542 ,  A61B6/583 ,  G01N23/046 ,  G01N2223/419 ,  G01T1/00 ,  G21K1/02 ,  G21K1/10 ,  G21K2201/062

Abstract: Systems and methods for detecting an image of an object using a multi-beam imaging system from an x-ray beam having a polychromatic energy distribution are disclosed. According to one aspect, a method can include generating a first X-ray beam having a polychromatic energy distribution. Further, the method can include positioning a plurality of monochromator crystals in a predetermined position to directly intercept the first X-ray beam such that a plurality of second X-ray beams having predetermined energy levels are produced. Further, an object can be positioned in the path of the second X-ray beams for transmission of the second X-ray beams through the object and emission from the object as transmitted X-ray beams. The transmitted X-ray beams can each be directed at an angle of incidence upon one or more crystal analyzers. Further, an image of the object can be detected from the beams diffracted from the analyzer crystals.

Abstract translation: 公开了一种使用多光束成像系统从具有多色能量分布的X射线束检测物体的图像的系统和方法。 根据一个方面，一种方法可以包括产生具有多色能量分布的第一X射线束。 此外，该方法可以包括将多个单色器晶体定位在预定位置以直接截取第一X射线束，使得产生具有预定能级的多个第二X射线束。 此外，物体可以位于第二X射线束的路径中，用于透射通过物体的第二X射线束和作为透射的X射线束从物体的发射。 透射的X射线束可以分别以一个或多个晶体分析器的入射角定向。 此外，可以从分析仪晶体衍射的光束检测物体的图像。