Invention Application
- Patent Title: SPECTROMETER FOR ANALYSING THE SPECTRUM OF A LIGHT BEAM
- Patent Title (中): 用于分析光束光谱的光谱仪
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Application No.: US14649065Application Date: 2013-11-29
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Publication No.: US20150300876A1Publication Date: 2015-10-22
- Inventor: Olivier ACHER , Simon RICHARD
- Applicant: HORIBA JOBIN YVON SAS
- Priority: FR1261627 20121204
- International Application: PCT/FR2013/052902 WO 20131129
- Main IPC: G01J3/02
- IPC: G01J3/02 ; G01J3/447

Abstract:
A spectrometer (100) for analyzing the spectrum of an upstream light beam (1) includes an entrance slit (101) and angular dispersing elements (130). The angular dispersing elements include at least one polarization-dependent diffraction grating that is suitable for, at the plurality of wavelengths (1, 2, 3), diffracting a corrected light beam (20) into diffracted light beams (31, 32, 33) in a given particular diffraction order of the polarization-dependent diffraction grating, which is either the +1 diffraction order or the −1 diffraction order, when the corrected light beam has a preset corrected polarization state that is circular; and the spectrometer includes elements for modifying polarization (1100) placed between the entrance slit and the angular dispersion elements, which are suitable for modifying the polarization state of the upstream light beam in order to generate the corrected light beam with a preset corrected polarization state.
Public/Granted literature
- US09709441B2 Spectrometer of high diffraction efficiency for analyzing the spectrum of a light beam Public/Granted day:2017-07-18
Information query