Invention Application
- Patent Title: Failure Mapping in a Storage Array
- Patent Title (中): 存储阵列中的故障映射
-
Application No.: US14454516Application Date: 2014-08-07
-
Publication No.: US20160041878A1Publication Date: 2016-02-11
- Inventor: John D. Davis , John Hayes , Zhangxi Tan , Hari Kannan , Nenad Miladinovic
- Applicant: Pure Storage, Inc.
- Main IPC: G06F11/14
- IPC: G06F11/14 ; G06F12/02 ; G06F11/16

Abstract:
A storage cluster is provided. The storage cluster includes a plurality of storage nodes within a chassis. The plurality of storage nodes has flash memory for storage of user data and is configured to distribute the user data and metadata throughout the plurality of storage nodes such that the storage nodes can access the user data with a failure of two of the plurality of storage nodes. Each of the storage nodes is configured to generate at least one address translation table that maps around defects in the flash memory on one of a per flash package basis, per flash die basis, per flash plane basis, per flash block basis, per flash page basis, or per physical address basis. Each of the plurality of storage nodes is configured to apply the at least one address translation table to write and read accesses of the user data.
Public/Granted literature
- US09558069B2 Failure mapping in a storage array Public/Granted day:2017-01-31
Information query