Invention Application
- Patent Title: SURFACE INSPECTION APPARATUS AND SURFACE INSPECTION METHOD
- Patent Title (中): 表面检查装置和表面检查方法
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Application No.: US14552188Application Date: 2014-11-24
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Publication No.: US20160054235A1Publication Date: 2016-02-25
- Inventor: Hyun Woo KIM , Jeong Hwan KO , Eui Seung CHUNG
- Applicant: KOREA AEROSPACE RESEARCH INSTITUTE
- Priority: KR10-2014-0108153 20140820
- Main IPC: G01N21/94
- IPC: G01N21/94 ; G01N21/88 ; G01N21/95
Abstract:
Provided are a surface inspection apparatus and a surface inspection method. More particularly, disclosed are a surface inspection apparatus and a surface inspection method to allow for inspection of a foreign material on non-uniformly colored diffusive surfaces containing a metal or polymer material or the like.
Information query
