Invention Application
- Patent Title: Charged Particle Beam System and Method of Operating a Charged Particle Beam System
- Patent Title (中): 带电粒子束系统和操作带电粒子束系统的方法
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Application No.: US14969352Application Date: 2015-12-15
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Publication No.: US20160104598A1Publication Date: 2016-04-14
- Inventor: John A. Notte, IV , FHM-Faridur Rahman , Weijie Huang , Shawn McVey
- Applicant: Carl Zeiss Microscopy, LLC
- Main IPC: H01J37/08
- IPC: H01J37/08 ; H01J27/26

Abstract:
The present disclosure relates to a gas field ion source comprising a housing, an electrically conductive tip arranged within the housing, a gas supply for supplying one or more gases to the housing, wherein the one or more gases comprise neon or a noble gas with atoms having a mass larger than neon, and an extractor electrode having a hole to permit ions generated in the neighborhood of the tip to pass through the hole. A surface of the extractor electrode facing the tip can be made of a material having a negative secondary ion sputter rate of less than 10−5 per incident neon ion.
Public/Granted literature
- US09640364B2 Charged particle beam system and method of operating a charged particle beam system Public/Granted day:2017-05-02
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