Invention Application
US20160209315A1 OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGRAM FOR OPTICAL ANALYSIS USING SINGLE LIGHT-EMITTING PARTICLE DETECTION 有权
光学分析装置,光学分析方法和使用单发光颗粒检测的光学分析的计算机程序

  • Patent Title: OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGRAM FOR OPTICAL ANALYSIS USING SINGLE LIGHT-EMITTING PARTICLE DETECTION
  • Patent Title (中): 光学分析装置,光学分析方法和使用单发光颗粒检测的光学分析的计算机程序
  • Application No.: US15084246
    Application Date: 2016-03-29
  • Publication No.: US20160209315A1
    Publication Date: 2016-07-21
  • Inventor: Tetsuya TanabeSeiji Kondo
  • Applicant: OLYMPUS CORPORATION
  • Applicant Address: JP Tokyo
  • Assignee: OLYMPUS CORPORATION
  • Current Assignee: OLYMPUS CORPORATION
  • Current Assignee Address: JP Tokyo
  • Priority: JP2013-210550 20131007
  • Main IPC: G01N15/06
  • IPC: G01N15/06 G02B21/16 G02B21/00
OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGRAM FOR OPTICAL ANALYSIS USING SINGLE LIGHT-EMITTING PARTICLE DETECTION
Abstract:
In the scanning molecule counting method using optical measurement with a confocal or multiphoton microscope, there is provided a technique of computing a light-emitting particle concentration which changes with time and detecting a concentration change velocity or a reaction velocity. The inventive optical analysis technique of detecting light of light-emitting particles in a sample solution generates time series light intensity data of light from a light detection region detected with moving the position of the light detection region of the microscope in the sample solution; measures successively an interval of generation times of signals of the light-emitting particles detected in the time series light intensity data; and determines the concentration or concentration change velocity of the light-emitting particles, using the successively measured signal generation time intervals.
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