Invention Application
- Patent Title: METHOD OF TARGETED MASS SPECTROMETRIC ANALYSIS
- Patent Title (中): 目标物质光谱分析方法
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Application No.: US15301129Application Date: 2014-10-23
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Publication No.: US20170016863A1Publication Date: 2017-01-19
- Inventor: Anatoly N. VERENCHIKOV
- Applicant: LECO Corporation
- Applicant Address: US MI St. Joseph
- Assignee: LECO Corporation
- Current Assignee: LECO Corporation
- Current Assignee Address: US MI St. Joseph
- International Application: PCT/US2014/061945 WO 20141023
- Main IPC: G01N30/72
- IPC: G01N30/72 ; H01J49/00 ; H01J49/14 ; H01J49/40

Abstract:
A method of targeted mass spectrometric analysis is provided for analyzing trace compounds at sub-ppb level compared to sample matrix. Sample is chromatographically separated at standard conditions to employ a map of target mass (M) versus retention time (RT). Small mass ions under M(RT) are rejected by RF field, and remaining ions are accumulated for pulsed injection into a multi-reflecting TOF MS, either directly from EI source, or from linear RF trap or via a heated RF only quadrupole with axial ion trapping. In combination with EI source the method provides sub femtogram sensitivity at matrices loads in microgram range.
Public/Granted literature
- US10006892B2 Method of targeted mass spectrometric analysis Public/Granted day:2018-06-26
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