Invention Application
- Patent Title: Methods and Apparatus for Thermal Testing of Antennas
- Patent Title (中): 天线热测试方法与装置
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Application No.: US14801159Application Date: 2015-07-16
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Publication No.: US20170016944A1Publication Date: 2017-01-19
- Inventor: Roger C. Esplin , Heath A. Strickland
- Applicant: RAYTHEON COMPANY
- Applicant Address: US MA Waltham
- Assignee: RAYTHEON COMPANY
- Current Assignee: RAYTHEON COMPANY
- Current Assignee Address: US MA Waltham
- Main IPC: G01R29/10
- IPC: G01R29/10

Abstract:
Methods and apparatus for thermal testing of an antenna. Embodiments enable positioning a unit under test having an antenna in an anechoic chamber and, manipulating a RF transparent heat chamber over the antenna. A system can raise a temperature in the heat chamber to a selected temperature and obtain antenna performance information while the antenna is heated in the heat chamber. Temperature affects on antenna performance can be determined.
Public/Granted literature
- US09891258B2 Methods and apparatus for thermal testing of antennas Public/Granted day:2018-02-13
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