Invention Application
- Patent Title: PERSISTENT COMMAND PARAMETER TABLE FOR PRE-SILICON DEVICE TESTING
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Application No.: US15724902Application Date: 2017-10-04
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Publication No.: US20180018250A1Publication Date: 2018-01-18
- Inventor: Dean G. Bair , Rebecca M. Gott , Edward J. Kaminski, JR. , William J. Lewis , Chakrapani Rayadurgam
- Applicant: International Business Machines Corporation
- Main IPC: G06F11/28
- IPC: G06F11/28 ; G11C29/44 ; G11C29/38 ; G06F11/27 ; G06F11/07 ; G06F11/263 ; G06F11/25 ; G11C29/54 ; G06F11/273

Abstract:
Embodiments relate to pre-silicon device testing using a persistent command table. An aspect includes receiving a value for a persistent command parameter from a user. Another aspect includes determining whether the value of the persistent command parameter is greater than zero. Another aspect includes based on determining whether the value of the persistent command parameter is greater than zero, selecting a number of commands equal to the value of the persistent command parameter from a regular command table of a driver of a device under test. Another aspect includes adding the selected commands to the persistent command table of the driver. Another aspect includes performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver.
Public/Granted literature
- US10289512B2 Persistent command parameter table for pre-silicon device testing Public/Granted day:2019-05-14
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