Invention Application
- Patent Title: MEASURING DEVICE AND MEASURING METHOD
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Application No.: US15714016Application Date: 2017-09-25
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Publication No.: US20180087966A1Publication Date: 2018-03-29
- Inventor: Tsugio GOMI
- Applicant: Seiko Epson Corporation
- Priority: JP2016-190768 20160929
- Main IPC: G01J3/46
- IPC: G01J3/46 ; B41F33/00

Abstract:
A measuring device is a measuring device that performs colorimetry of an evaluation patch formed on a medium and a paper white patch that is a portion exposed by the medium. The measuring device has a light source portion that irradiates the medium with an illumination light, a measurement portion that acquires an amount of light from the medium as a measurement value, a memory that holds a paper white standard value that is a reference measurement value of the paper white patch, and a colorimetry unit that corrects a measurement value of the evaluation patch based on the measurement value of the paper white patch and the paper white standard value. Even in a case where a measurement position is changed, a reflectance of the evaluation patch is accurately calculated and a chromaticity of the evaluation patch can be accurately acquired.
Public/Granted literature
- US10228285B2 Measuring device and measuring method Public/Granted day:2019-03-12
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