Invention Application
- Patent Title: SPECTROSCOPE, AND SPECTROSCOPE PRODUCTION METHOD
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Application No.: US15749539Application Date: 2016-08-04
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Publication No.: US20180216997A1Publication Date: 2018-08-02
- Inventor: Takafumi YOKINO , Katsumi SHIBAYAMA , Katsuhiko KATO
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Priority: JP2015-153862 20150804
- International Application: PCT/JP2016/073016 WO 20160804
- Main IPC: G01J3/18
- IPC: G01J3/18 ; B29C43/02 ; G01J3/36 ; G02B5/18 ; G02B5/32

Abstract:
A spectrometer includes a support having a bottom wall part in which a depression is provided and a side wall part, a light detection element supported by the side wall part while opposing the depression, a resin layer disposed at least on an inner surface of the depression, and a dispersive part provided in the resin layer on the inner surface of the depression. The resin layer is in contact with an inner surface of the side wall part. A thickness of the resin layer in a first direction in which the depression and the light detection element oppose each other is larger in a part in contact with the inner surface of the side wall part than in a part disposed on the inner surface of the depression.
Public/Granted literature
- US10408677B2 Spectroscope, and spectroscope production method Public/Granted day:2019-09-10
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