Invention Application
- Patent Title: ADJUSTABLE PROBE DEVICE FOR IMPEDANCE TESTING FOR CIRCUIT BOARD
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Application No.: US17034741Application Date: 2020-09-28
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Publication No.: US20210102992A1Publication Date: 2021-04-08
- Inventor: YANG-HUNG CHENG , YA-HUNG LO , CHIEN-HSUN CHEN , CHIA-NAN CHOU , CHUNG-YEN HUANG , SHOU-JEN TSAI , FUH-CHYUN TANG
- Applicant: MPI CORPORATION
- Applicant Address: TW Chu-Pei City
- Assignee: MPI CORPORATION
- Current Assignee: MPI CORPORATION
- Current Assignee Address: TW Chu-Pei City
- Priority: TW109116424 20200518,TW109130249 20200903
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R1/073

Abstract:
An adjustable probe device includes fixed and movable probes, at least one of which is a signal probe having a coaxial structure. The movable probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. Another adjustable probe device includes a first movable probe for being grounded, and fixed and second movable probes both having a coaxial structure. Any of the two movable probes is selectable to be a functioning probe in a way that the contact ends of the functioning and fixed probes are located on a same plane for contacting two pads of a DUT at the same time, and the functioning probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. As a result, the probe interval is adjustable, lowering the cost of the impedance testing apparatus for circuit boards.
Public/Granted literature
- US11460498B2 Adjustable probe device for impedance testing for circuit board Public/Granted day:2022-10-04
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