Invention Application
- Patent Title: LITHOGRAPHIC PROCESS & APPARATUS AND INSPECTION PROCESS AND APPARATUS
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Application No.: US17520803Application Date: 2021-11-08
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Publication No.: US20220057719A1Publication Date: 2022-02-24
- Inventor: Wim Tjibbo TEL , Hans Erik KATTOUW , Valerio ALTINI , Bearrach MOEST
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: NL Veldhoven
- Priority: EP16207472.8 20161230
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G03F9/00

Abstract:
A lithographic apparatus and associated method of controlling a lithographic process. The lithographic apparatus has a controller configured to define a control grid associated with positioning of a substrate within the lithographic apparatus. The control grid is based on a device layout, associated with a patterning device, defining a device pattern which is to be, and/or has been, applied to the substrate in a lithographic process.
Public/Granted literature
- US11599027B2 Lithographic process and apparatus and inspection process and apparatus Public/Granted day:2023-03-07
Information query
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