Invention Application
- Patent Title: METHOD AND SYSTEM FOR FORMING PATTERNED FEATURES ON A SURFACE OF A SUBSTRATE
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Application No.: US17460673Application Date: 2021-08-30
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Publication No.: US20220068647A1Publication Date: 2022-03-03
- Inventor: SeungHyun Lee , YeaHyun Gu , Hyunchul Kim , Naoki Inoue
- Applicant: ASM IP Holding B.V.
- Applicant Address: NL Almere
- Assignee: ASM IP Holding B.V.
- Current Assignee: ASM IP Holding B.V.
- Current Assignee Address: NL Almere
- Main IPC: H01L21/033
- IPC: H01L21/033 ; H01J37/32 ; C23C16/455

Abstract:
Methods of forming patterned features on a surface of a substrate are disclosed. Exemplary methods include using a plasma-enhanced cyclical deposition process to form a transformable layer including a first material and exposing the transformable layer to energy to form a second material. The first or second material can be selectively etched relative to the other of the first and second material.
Information query
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