Invention Application
- Patent Title: SMART SAMPLING FOR BLOCK FAMILY SCAN
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Application No.: US17877810Application Date: 2022-07-29
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Publication No.: US20220366997A1Publication Date: 2022-11-17
- Inventor: Vamsi Pavan Rayaprolu , Shane Nowell , Michael Sheperek , Steven Michael Kientz
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Main IPC: G11C29/44
- IPC: G11C29/44 ; G11C29/42 ; G11C29/12 ; G11C29/10 ; G11C16/34

Abstract:
A system can include a memory device and a processing device to perform operations that include determining a calibration scan frequency based on an amount of elapsed time since a previous write operation performed on the memory device, determining, based on the calibration scan frequency, whether one or more scan criteria are satisfied, responsive to determining that the one or more scan criteria are satisfied, identifying one or more block families, and calibrating one or more bin pointers of each of the identified block families, wherein the calibrating comprises: for each of the identified block families, updating each of the one or more bin pointers of the identified block family based on a data state metric of at least one block of the identified block family.
Public/Granted literature
- US11721409B2 Smart sampling for block family scan Public/Granted day:2023-08-08
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