NEAR-INFRARED CUT FILTER AND IMAGING DEVICE HAVING SAME
Abstract:
A near-infrared cut filter is provided which has extremely low incident angle dependence and excellent oblique incidence characteristics. The near-infrared cut filter comprises a transparent substrate having a thickness of 0.16 to 0.26 mm and an average transmittance in a wavelength range of 800 to 1100 nm of 1% or less, and a resin layer formed at least one main surface of the transparent substrate and configured to absorb light of a specific wavelength.
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