NEAR-INFRARED CUT-OFF FILTER AND IMAGING DEVICE INCLUDING THE SAME

    公开(公告)号:US20210165145A1

    公开(公告)日:2021-06-03

    申请号:US17109415

    申请日:2020-12-02

    Inventor: Takeshi YAMAZAKI

    Abstract: Provided is a near-infrared cut-off filter having excellent oblique incidence characteristics due to extremely low dependence on the angle of incidence, and a low transmittance in a wavelength region of 1000 nm or more. More particularly, the near-infrared cut-off filter includes a transparent substrate that is formed of glass containing iron atoms and has a half-value wavelength of greater than 630 nm on a long wavelength side of a transmittance curve and an average transmittance of 1% or less in a wavelength region of 1000 to 1200 nm; and a resin layer formed on at least one main surface of the transparent substrate to absorb light of a specific wavelength.

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