Invention Application
- Patent Title: Charged Particle Beam System and Control Method Therefor
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Application No.: US17964516Application Date: 2022-10-12
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Publication No.: US20230115486A1Publication Date: 2023-04-13
- Inventor: Takeshi Kaneko , Isamu Ishikawa , Eiji Okunishi
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Priority: JP2021-168130 20211013
- Main IPC: H01J37/04
- IPC: H01J37/04 ; H01J37/26 ; H01J37/20

Abstract:
Provided is a charged particle beam system capable of preventing the data acquisition time from increasing. A control method for the system is also provided. The charged particle beam system includes: a beam blanker for blanking a charged particle beam; a sample stage on which a sample is tiltably held and thus can assume a tilt angle; a blanking controller for controlling the blanking of the charged particle beam and causing a pulsed beam having a duty ratio to be directed at the sample; and a tilt controller for controlling the tilt angle of the sample. The blanking controller sets the duty ratio of the pulsed beam based on the tilt angle of the sample.
Public/Granted literature
- US12261013B2 Charged particle beam system and control method therefor Public/Granted day:2025-03-25
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