Invention Publication
- Patent Title: GAS ANALYZING APPARATUS AND CONTROL METHOD
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Application No.: US18261412Application Date: 2022-01-25
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Publication No.: US20240068989A1Publication Date: 2024-02-29
- Inventor: Naoki TAKAHASHI
- Applicant: ATONARP INC.
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: ATONARP INC.
- Current Assignee: ATONARP INC.
- Current Assignee Address: JP Minato-ku,Tokyo
- Priority: JP 21013409 2021.01.29
- International Application: PCT/JP2022/002616 2022.01.25
- Date entered country: 2023-07-13
- Main IPC: G01N27/623
- IPC: G01N27/623 ; H01J49/04 ; H01J49/10 ; H01J49/42

Abstract:
A gas analyzing apparatus includes: an ionization device that generates an ion flow of a sample gas; an analyzer that analyzes the ion flow supplied from the ionization device; a first ion path that non-linearly guides the ion flow from the ionization device to an inlet of the analyzer; and a blocking device for intermittently blocking and releasing, using an electric field or a magnetic field, the ion flow on at least part of a path of the ion flow through the first ion path to a mass filter of the analyzer. It is possible to perform measurement in a state where the ion flow is blocked and measurement in a state where the ion flow is not blocked.
Public/Granted literature
- US12078611B2 Gas analyzing apparatus and control method Public/Granted day:2024-09-03
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