• Patent Title: GAS ANALYZING APPARATUS AND CONTROL METHOD
  • Application No.: US18261412
    Application Date: 2022-01-25
  • Publication No.: US20240068989A1
    Publication Date: 2024-02-29
  • Inventor: Naoki TAKAHASHI
  • Applicant: ATONARP INC.
  • Applicant Address: JP Minato-ku, Tokyo
  • Assignee: ATONARP INC.
  • Current Assignee: ATONARP INC.
  • Current Assignee Address: JP Minato-ku,Tokyo
  • Priority: JP 21013409 2021.01.29
  • International Application: PCT/JP2022/002616 2022.01.25
  • Date entered country: 2023-07-13
  • Main IPC: G01N27/623
  • IPC: G01N27/623 H01J49/04 H01J49/10 H01J49/42
GAS ANALYZING APPARATUS AND CONTROL METHOD
Abstract:
A gas analyzing apparatus includes: an ionization device that generates an ion flow of a sample gas; an analyzer that analyzes the ion flow supplied from the ionization device; a first ion path that non-linearly guides the ion flow from the ionization device to an inlet of the analyzer; and a blocking device for intermittently blocking and releasing, using an electric field or a magnetic field, the ion flow on at least part of a path of the ion flow through the first ion path to a mass filter of the analyzer. It is possible to perform measurement in a state where the ion flow is blocked and measurement in a state where the ion flow is not blocked.
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