Invention Grant
US3670162A Charged particle analyzer 失效
充电颗粒分析仪

Charged particle analyzer
Abstract:
A charged particle analyzer for analyzing charged particles with respect to their specific mass is disclosed. The charged particle analyzer employs the principle of crossed electric and magnetic fields to obtain perfect double focusing and high resolution. The electric field is radial in direction and proportional in magnitude to the radius of the analyzer at any point in the flight cylinder and is normal to the magnetic field. A suitable source of ions is provided to permit introduction of ions into the analyzer and a suitable ion receiver is provided to receive ions from the analyzer.
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