Charged particle analyzer
    1.
    发明授权
    Charged particle analyzer 失效
    充电颗粒分析仪

    公开(公告)号:US3670162A

    公开(公告)日:1972-06-13

    申请号:US3670162D

    申请日:1970-09-23

    Applicant: AVCO CORP

    Inventor: ELMORE ROBERT E

    CPC classification number: H01J49/328

    Abstract: A charged particle analyzer for analyzing charged particles with respect to their specific mass is disclosed. The charged particle analyzer employs the principle of crossed electric and magnetic fields to obtain perfect double focusing and high resolution. The electric field is radial in direction and proportional in magnitude to the radius of the analyzer at any point in the flight cylinder and is normal to the magnetic field. A suitable source of ions is provided to permit introduction of ions into the analyzer and a suitable ion receiver is provided to receive ions from the analyzer.

    Abstract translation: 公开了一种用于分析带电粒子相对于其特定质量的带电粒子分析仪。 带电粒子分析仪采用交叉电场和磁场的原理,获得完美的双重聚焦和高分辨率。 电场在方向上是径向的,并且在大小上与分析器在飞行缸中的任何点处的半径成比例,并且与磁场垂直。 提供合适的离子源以允许将离子引入分析器中,并且提供合适的离子接收器以从分析器接收离子。

Patent Agency Ranking