Invention Grant
- Patent Title: Atomic emission spectrometer with background compensation
- Patent Title (中): 具有背景补偿的原子发射光谱仪
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Application No.: US526779Application Date: 1990-05-17
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Publication No.: US5087123APublication Date: 1992-02-11
- Inventor: Edgar Gerlacher , Carl G. Dencks , Uwe Gunther , Gunther Rodel
- Applicant: Edgar Gerlacher , Carl G. Dencks , Uwe Gunther , Gunther Rodel
- Applicant Address: DEX Uberlingen
- Assignee: Bodenseewerk Perkin Elmer GmbH
- Current Assignee: Bodenseewerk Perkin Elmer GmbH
- Current Assignee Address: DEX Uberlingen
- Priority: DEX3811923 19880409
- Main IPC: G01J3/12
- IPC: G01J3/12 ; G01J3/18 ; G01J3/28 ; G01J3/36 ; G01J3/443 ; G01N21/73 ; G01N21/74
Abstract:
A method of and a device for multi-element measurement of elements in a sample with correction for background emission. The method starts with atomizing a sample and then exciting the transformed atoms to emit light containing characteristic spectral lines for each element, followed by generating a spectrum of spectral lines characteristic of the elements, followed by measuring the intensity of selected spectral lines falling within a predetermined measuring range without changing their intensity. The next steps are sensing the background emission adjacent the selected spectral lines simultaneously with measuring the intensity of selected spectral lines and determining the concentration of each element from the measured intensity of the corresponding spectral line and sensed background emission.
Public/Granted literature
- US4211815A Waterproofing of textiles Public/Granted day:1980-07-08
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