Invention Grant
- Patent Title: Sample holding and positioning mechanism and method for optical analysis
- Patent Title (中): 样品保持定位机理及光学分析方法
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Application No.: US848692Application Date: 1992-03-09
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Publication No.: US5227856APublication Date: 1993-07-13
- Inventor: David S. Reed , Robert C. Funk
- Applicant: David S. Reed , Robert C. Funk
- Applicant Address: NV Reno
- Assignee: Perten Instruments North America Inc.
- Current Assignee: Perten Instruments North America Inc.
- Current Assignee Address: NV Reno
- Main IPC: G01N21/03
- IPC: G01N21/03 ; G01N21/35 ; G01N21/47 ; G01N30/74
Abstract:
A sample holding apparatus (20) and method for use with an optical analyzing assembly (10) for irradiating a sample (33) with light energy. The sample holder apparatus (20) comprises a sample container (30) having a downwardly facing container opening (44), and a partition (32) movably positioned over the opening (44). A container support (24) is positioned adjacent the partition (32) and includes a surface (26) having an analyzing window (28) for transmitting the light energy therethrough. The container (30) is movably mounted to a transport mechanism (36) which permits the partition (32) to slidably retract from a closed position, across the opening (44), to an open position as the container (30) is urged onto the support surface (26). Consequently, the sample (33) contained in the container (30) is exposed and drawn into direct contact with the analyzing window (28). The wall members (38) of the container (30) retain the particulates of the sample (33) in substantially a same position during the relative movement.
Public/Granted literature
- US5854461A Welding shield Public/Granted day:1998-12-29
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