Invention Grant
- Patent Title: Probe scanning apparatus for probe microscope
- Patent Title (中): 探针显微镜探头扫描仪
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Application No.: US968193Application Date: 1997-11-12
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Publication No.: US5965885APublication Date: 1999-10-12
- Inventor: Akira Inoue
- Applicant: Akira Inoue
- Applicant Address: JPX
- Assignee: Seiko Instruments Inc.
- Current Assignee: Seiko Instruments Inc.
- Current Assignee Address: JPX
- Main IPC: G01B21/30
- IPC: G01B21/30 ; F16F9/30 ; G01B7/34 ; G01N27/00 ; G01N37/00 ; G01Q10/00 ; G01Q10/04 ; G01Q90/00 ; G01R22/02 ; H01J37/00
Abstract:
A spring is connected to an edge section of a sample side of a spindle receiving a force in the Z-axial direction by a first poise coil motor, and a probe is attached to the tip of the spring. The spindle is supported by an internal tube with a spring. The movement of the spindle is enlarged by the spring to be conveyed to the probe, whereby displacement of the probe is amplified. For this reason, a resonance frequency f0 of a system comprising the movable element of the first poise coil motor, spindle, spring, spring and probe can be increased. If the spring is changed to springs in two stages, a resonance frequency f0 of the system can be increased with comparatively compact configuration.
Public/Granted literature
- US4216951A Baby changing apparatus Public/Granted day:1980-08-12
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