Invention Grant
- Patent Title: Method for determination of the radiation stability of crystals
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Application No.: US09975173Application Date: 2001-10-11
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Publication No.: US06603547B2Publication Date: 2003-08-05
- Inventor: Ewald Moersen , Burkhard Speit , Lorenz Strenge , Joerg Kandler
- Applicant: Ewald Moersen , Burkhard Speit , Lorenz Strenge , Joerg Kandler
- Priority: DE10050349 20001011
- Main IPC: G01J330
- IPC: G01J330

Abstract:
The method for determining radiation stability of a crystal to radiation of a working wavelength to be employed in a subsequent application includes taking a first absorption spectrum (A) of a cleaved piece of the crystal with a given thickness (D) over a predetermined wavelength range from a first wavelength (&lgr;1) to a second wavelength (&lgr;2) by means of a spectrophotometer. Then the cleaved piece of the crystal is irradiated with an energetic radiation source so as to form all theoretically possible color centers (saturation). After the irradiating a second absorption spectrum (B) of the cleaved piece of crystal is taken over the same predetermined wavelength range. Then a surface integral of a difference spectrum of the first absorption spectrum and the second absorption spectrum over the predetermined wavelength range is formed and divided by the thickness (D) to obtain a scaled surface integral value. The absorption coefficient &Dgr;k at the working wavelength for the subsequent application is then obtained preferably from the scaled surface integral value for the damage induced by the energetic radiation and a calibration curve relating the absorption coefficient at the working wavelength to the surface integral of the absorption coefficient induced by the energetic radiation.
Public/Granted literature
- US20020105643A1 Method for determination of the radiation stability of crystals Public/Granted day:2002-08-08
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