Invention Grant
- Patent Title: Low temperature plasma Si or SiGe for MEMS applications
- Patent Title (中): 用于MEMS应用的低温等离子体Si或SiGe
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Application No.: US10210315Application Date: 2002-08-01
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Publication No.: US06770569B2Publication Date: 2004-08-03
- Inventor: Juergen A. Foerstner , Steven M. Smith , Raymond Mervin Roop
- Applicant: Juergen A. Foerstner , Steven M. Smith , Raymond Mervin Roop
- Main IPC: H01L2131
- IPC: H01L2131

Abstract:
A method is provided for making a MEMS structure (69). In accordance with the method, a CMOS substrate (51) is provided which has interconnect metal (53) deposited thereon. A MEMS structure is created on the substrate through the plasma assisted chemical vapor deposition (PACVD) of a material selected from the group consisting of silicon and silicon-germanium alloys. The low deposition temperatures attendant to the use of PACVD allow these materials to be used for MEMS fabrication at the back end of an integrated CMOS process.
Public/Granted literature
- US20040023429A1 Low temperature plasma Si or SiGe for MEMS applications Public/Granted day:2004-02-05
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