Invention Grant
- Patent Title: Carbon and halogen doped silicate glass dielectric layer and method for fabricating the same
- Patent Title (中): 碳和卤素掺杂的硅酸盐玻璃介电层及其制造方法
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Application No.: US10729217Application Date: 2003-12-04
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Publication No.: US06979656B2Publication Date: 2005-12-27
- Inventor: Shiu-Ko Jangjian , Jun Wu , Chi-Wen Liu , Ying-Lung Wang , Yi-Lung Cheng , Michael Chang , Szu-An Wu
- Applicant: Shiu-Ko Jangjian , Jun Wu , Chi-Wen Liu , Ying-Lung Wang , Yi-Lung Cheng , Michael Chang , Szu-An Wu
- Applicant Address: TW Hsin Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin Chu
- Agency: Tung & Associates
- Main IPC: H01L21/31
- IPC: H01L21/31 ; H01L21/316 ; H01L21/76 ; H01L23/532 ; H01L23/58

Abstract:
A method for fabricating a dielectric layer provides for use of a carbon source material separate from a halogen source material when forming a carbon and halogen doped silicate glass dielectric layer. The use of separate carbon and halogen source materials provides enhanced process latitude when forming the carbon and halogen doped silicate glass dielectric layer. Such a carbon and halogen doped silicate glass dielectric layer having a dielectric constant greater than about 3.0 is particularly useful as an intrinsic planarizing stop layer within a damascene method. A bilayer dielectric layer construction comprising a carbon and halogen doped silicate glass and a carbon doped silicate glass dielectric layer absent halogen doping is useful within a dual damascene method.
Public/Granted literature
- US20050121751A1 Carbon and halogen doped silicate glass dielectric layer and method for fabricating the same Public/Granted day:2005-06-09
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