Invention Grant
US07199355B2 Methods and apparatuses for the exact determination of an angle of rotation 有权
用于精确确定旋转角度的方法和装置

  • Patent Title: Methods and apparatuses for the exact determination of an angle of rotation
  • Patent Title (中): 用于精确确定旋转角度的方法和装置
  • Application No.: US11216217
    Application Date: 2005-08-31
  • Publication No.: US07199355B2
    Publication Date: 2007-04-03
  • Inventor: Heinz Lippuner
  • Applicant: Heinz Lippuner
  • Applicant Address: CH Heerbrugg
  • Assignee: Leica Geosystems AG
  • Current Assignee: Leica Geosystems AG
  • Current Assignee Address: CH Heerbrugg
  • Agent John K McCulloch
  • Priority: CH1463/04 20040903
  • Main IPC: G01D5/34
  • IPC: G01D5/34
Methods and apparatuses for the exact determination of an angle of rotation
Abstract:
In a method according to the invention for the accurate determination of an angle of rotation (w) about an axis (a), at least a part of a plurality of pattern elements (5, ..., 13) arranged around a pattern center (4), a multiplicity of which are arranged one behind the other in a rotation, is at least partly focused by optical beams on a multiplicity of detector elements (2) of an optical detector (1) which are arranged in series. The pattern elements (5, ..., 13) are arranged on a rotating body (3) which is connected to the detector (1) so as to be rotatable about the axis (a). Positions (p) of the focused pattern elements are resolved by the detector elements (2) of one and the same detector (1). In a first step, effects of an eccentricity (e) of the pattern center (4) relative to the axis (a) on the determination of an angle of rotation are computationally determined from resolved positions (p) of at least one pattern element (5, ..., 13). In a second step, the angle of rotation (w) is accurately determined from the resolved positions (p1, p2, p3) of pattern elements (5, 6, 7) arranged one behind the other taking into account the effects determined.
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