Invention Grant
- Patent Title: Arcuate blade probe
- Patent Title (中): 弧形刀片探针
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Application No.: US11221258Application Date: 2005-09-06
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Publication No.: US07248065B2Publication Date: 2007-07-24
- Inventor: Alexander Leon
- Applicant: Alexander Leon
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
An arcuate blade probe is disclosed. The arcuate blade probe includes a shaft with a pair of faces that converge towards each other along a probe axis and terminate at a single edge that includes an arcuate profile. The arcuate profile provides a surface that makes an electrical connection between the edge and a node to be probed. The connection can be made along at least one portion of the edge. The edge can be used to probe lead-based and lead-free solder on the pads of vias and test pads. The arcuate profile give the edge a gradual arc that does not come to a sharp point so that the edge can probe vias with plugged holes.
Public/Granted literature
- US20060238208A1 Arcuate blade probe Public/Granted day:2006-10-26
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