Invention Grant
US07652763B2 Apparatus for depth-selective Raman spectroscopy 有权
深度选择拉曼光谱仪器

Apparatus for depth-selective Raman spectroscopy
Abstract:
Apparatus and methods for detecting Raman spectral features non destructively from sub-surface regions of a diffusely scattering sample are disclosed. Incident radiation is supplied at one or more sample surface entry regions, and light is collected from one or more collection regions spaced from the entry regions. Raman features are detected in the collected light, and depth information is derived according to the entry-collection spacings.
Public/Granted literature
Information query
Patent Agency Ranking
0/0