Invention Grant
- Patent Title: Interferometer with Double Polarizing Beam Splitter
- Patent Title (中): 带双极化分束器的干涉仪
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Application No.: US11931622Application Date: 2007-10-31
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Publication No.: US07652771B2Publication Date: 2010-01-26
- Inventor: Greg C Felix
- Applicant: Greg C Felix
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
An interferometer has a first reflective surface having a nominal orientation; a second reflective surface having a nominal orientation orthogonal to the nominal orientation of the first reflective surface; a retroreflector facing the first reflective surface; a double polarizing beam splitter (DPBS) between the first reflective surface and the retroreflector; and a respective quarter-wave plate between the DPBS and each of the reflective surfaces. The DPBS has first and second beam-splitting surfaces each having a nominal orientation with respect to the first reflective surface. At least part of at least one of the first reflective surface, the second reflective surface and the beam-splitting surfaces is effectively tilted relative to the respective nominal orientation of such surface, and constitutes a respective tilted surface.
Public/Granted literature
- US20090109442A1 Interferometer with Double Polarizing Beam Splitter Public/Granted day:2009-04-30
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