Interferometer with Double Polarizing Beam Splitter
    1.
    发明授权
    Interferometer with Double Polarizing Beam Splitter 有权
    带双极化分束器的干涉仪

    公开(公告)号:US07652771B2

    公开(公告)日:2010-01-26

    申请号:US11931622

    申请日:2007-10-31

    Applicant: Greg C Felix

    Inventor: Greg C Felix

    Abstract: An interferometer has a first reflective surface having a nominal orientation; a second reflective surface having a nominal orientation orthogonal to the nominal orientation of the first reflective surface; a retroreflector facing the first reflective surface; a double polarizing beam splitter (DPBS) between the first reflective surface and the retroreflector; and a respective quarter-wave plate between the DPBS and each of the reflective surfaces. The DPBS has first and second beam-splitting surfaces each having a nominal orientation with respect to the first reflective surface. At least part of at least one of the first reflective surface, the second reflective surface and the beam-splitting surfaces is effectively tilted relative to the respective nominal orientation of such surface, and constitutes a respective tilted surface.

    Abstract translation: 干涉仪具有具有标称取向的第一反射表面; 具有与第一反射表面的标称取向正交的标称取向的第二反射表面; 面向第一反射面的回射器; 在所述第一反射表面和所述后向反射器之间的双偏振分束器(DPBS); 以及在DPBS和每个反射表面之间的相应四分之一波片。 DPBS具有第一和第二光束分离表面,每个具有相对于第一反射表面的标称取向。 第一反射表面,第二反射表面和分束表面中的至少一个的至少一部分相对于这种表面的相应标称取向被有效地倾斜,并且构成相应的倾斜表面。

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