Invention Grant
US07656207B2 Delay locked loop circuit having coarse lock time adaptive to frequency band and semiconductor memory device having the delay locked loop circuit
失效
具有自适应频带的粗锁定时间的延迟锁定环路电路和具有延迟锁相环电路的半导体存储器件
- Patent Title: Delay locked loop circuit having coarse lock time adaptive to frequency band and semiconductor memory device having the delay locked loop circuit
- Patent Title (中): 具有自适应频带的粗锁定时间的延迟锁定环路电路和具有延迟锁相环电路的半导体存储器件
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Application No.: US12009080Application Date: 2008-01-16
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Publication No.: US07656207B2Publication Date: 2010-02-02
- Inventor: Young-yong Byun
- Applicant: Young-yong Byun
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Mills & Onello, LLP
- Priority: KR10-2007-0005438 20070117
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
Provided are a DLL circuit having a coarse lock time adaptive to a frequency band of an external clock signal and a semiconductor memory device having the DLL circuit. The DLL circuit includes a delay circuit, a replica circuit, and a phase detector. The phase detector generates a first comparison signal used by the delay circuit to delay an external clock signal in units of a first cell delay time or a second comparison signal used by the delay circuit to delay the external clock signal in units of a second cell delay time. The DLL circuit delays the external clock signal by the cell delay time adaptive to the frequency band of the external clock signal, and thus can perform an accurate and rapid coarse lock operation for the entire frequency band.
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