Invention Grant
- Patent Title: Apparatus for the determination of surface properties
- Patent Title (中): 用于测定表面性能的装置
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Application No.: US11230295Application Date: 2005-09-19
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Publication No.: US07659994B2Publication Date: 2010-02-09
- Inventor: Uwe Sperling
- Applicant: Uwe Sperling
- Applicant Address: DE Geretsried
- Assignee: BYK Gardner GmbH
- Current Assignee: BYK Gardner GmbH
- Current Assignee Address: DE Geretsried
- Agency: Greer, Burns & Crain, Ltd.
- Priority: DE102004058408 20041203
- Main IPC: G01B11/30
- IPC: G01B11/30

Abstract:
A device for determining properties of surfaces having at least one first radiation device having at least one radiation source emitting radiation, having at least one first radiation detector having a first radiation detector element which captures at least a portion of the radiation emitted from the radiation device and subsequently diffused and/or reflected off a measuring surface and emits at least one measuring signal characteristic of the reflected/diffused radiation, and at least one second radiation detector having a second radiation detector element capturing a portion of the radiation from the radiation device and diffused/reflected off a measuring surface and outputs a measuring signal characteristic of the reflected and/or diffused radiation, and at least one filter device which is placeable both in the optical path between the radiation device and the first radiation detector and in the optical path between the radiation device and the second radiation detector.
Public/Granted literature
- US20070206195A1 Apparatus for the determination of surface properties Public/Granted day:2007-09-06
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