Invention Grant
- Patent Title: Spectrometric measuring probe and method for recalibrating the same
- Patent Title (中): 光谱测量探头及其重新校准方法
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Application No.: US11587453Application Date: 2005-04-26
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Publication No.: US07671984B2Publication Date: 2010-03-02
- Inventor: Wilhelm Schebesta , Werner Hoyme , Michael Rode , Nico Correns , Martin Goetz
- Applicant: Wilhelm Schebesta , Werner Hoyme , Michael Rode , Nico Correns , Martin Goetz
- Applicant Address: DE Jena
- Assignee: Carl Zeiss MicroImaging GmbH
- Current Assignee: Carl Zeiss MicroImaging GmbH
- Current Assignee Address: DE Jena
- Agency: Reed Smith LLP
- Priority: DE102004021448 20040430; DE102004048102 20040930
- International Application: PCT/EP2005/004433 WO 20050426
- International Announcement: WO2005/106431 WO 20051110
- Main IPC: G01J3/28
- IPC: G01J3/28

Abstract:
An arrangement for measuring the diffuse reflection of samples and a method for internal recalibration of the measuring head. The spectrometric measuring head with a device for recalibration comprises a housing which is provided with a window and which contains an illumination source, a spectrometer arrangement and at least two standards for internal recalibration. The two standards can be swiveled into the beam path of the measuring head selectively so that the measurement light emitted by the illumination source can be used in its entirety for recalibration. A processor for acquiring and processing measured values and an interface to a bus system are arranged in the housing. Accordingly, relatively time-consuming calibration of the measuring head at the place of use is required only before putting into operation or at longer time intervals. By the internal recalibrations, it is possible to prevent changes in the measured values in long-term operation.
Public/Granted literature
- US20070236692A1 Spectrometric Measuring Probe and Method for Recalibrating the Same Public/Granted day:2007-10-11
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