Invention Grant
- Patent Title: Color inspection system
- Patent Title (中): 彩色检测系统
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Application No.: US11795707Application Date: 2006-03-29
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Publication No.: US07684041B2Publication Date: 2010-03-23
- Inventor: Takao Ebita , Norihiro Ogata , Masahiro Matsumura , Keiichirou Tabata
- Applicant: Takao Ebita , Norihiro Ogata , Masahiro Matsumura , Keiichirou Tabata
- Applicant Address: JP Fukui-shi
- Assignee: Seiren Co., Ltd.
- Current Assignee: Seiren Co., Ltd.
- Current Assignee Address: JP Fukui-shi
- Agency: Flynn, Thiel, Boutell & Tanis, P.C.
- Priority: JP2005-096601 20050330
- International Application: PCT/JP2006/306414 WO 20060329
- International Announcement: WO2006/106707 WO 20061012
- Main IPC: G01J3/50
- IPC: G01J3/50

Abstract:
A color inspection system capable of making a determination on pass or failure with accuracy equivalent to that for the case of a visual inspection even in the case of inspecting various textile products as measurement targets, such as raised cloth, cloth with printed patterns such as a marbled pattern, moire pattern and detailed pattern is provided. With the color inspection system, an illuminant is set to shine a light on the surface of a textile product placed on the top surface of a measuring platform to thereby make measurements from a direction at an angle of 45 degrees from the surface of a measuring region of the textile product by use of a spectroradiometer of a measuring unit. The spectroradiometer is provided with a wide range lens attached thereto to thereby expand a measuring region. The results of measurement by the spectroradiometer are inputted to an information processor of a determination unit. The information processor computes color values for the whole measuring region to be compared with standard color values stored in a memory to thereby make a determination on pass or fail.
Public/Granted literature
- US20090190132A1 Color Inspection System Public/Granted day:2009-07-30
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