Invention Grant
US07692142B2 Differential-pressure dual ion trap mass analyzer and methods of use thereof 有权
差压双离子阱质量分析仪及其使用方法

Differential-pressure dual ion trap mass analyzer and methods of use thereof
Abstract:
A dual ion trap mass analyzer includes adjacently positioned first and second two-dimensional ion traps respectively maintained at relatively high and low pressures. Functions favoring high pressure (cooling and fragmentation) may be performed in the first trap, and functions favoring low pressure (isolation and analytical scanning) may be performed in the second trap. Ions may be transferred between the first and second trap through a plate lens having a small aperture that presents a pumping restriction and allows different pressures to be maintained in the two traps. The differential-pressure environment of the dual ion trap mass analyzer facilitates the use of high-resolution analytical scan modes without sacrificing ion capture and fragmentation efficiencies.
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