Invention Grant
US07700905B2 Radiation detector with controlled spectral sensitivity distribution
有权
具有受控光谱灵敏度分布的辐射检测器
- Patent Title: Radiation detector with controlled spectral sensitivity distribution
- Patent Title (中): 具有受控光谱灵敏度分布的辐射检测器
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Application No.: US10573095Application Date: 2004-08-24
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Publication No.: US07700905B2Publication Date: 2010-04-20
- Inventor: Heinz Haas , Frank Möllmer , Michael Schwind
- Applicant: Heinz Haas , Frank Möllmer , Michael Schwind
- Applicant Address: DE Regensburg
- Assignee: Osram Opto Semiconductors GmbH
- Current Assignee: Osram Opto Semiconductors GmbH
- Current Assignee Address: DE Regensburg
- Agency: Fish & Richardson P.C.
- Priority: DE10345410 20030930
- International Application: PCT/DE2004/001877 WO 20040824
- International Announcement: WO2005/041247 WO 20050506
- Main IPC: G01J3/50
- IPC: G01J3/50

Abstract:
The invention concerns a radiation detector for detecting radiation having a defined spectral sensitivity distribution (14) that exhibits a sensitivity maximum at a defined wavelength λ0, wherein the radiation detector preferably contains a III-V semiconductor material and particularly preferably comprises at least one semiconductor chip (1) and at least one optical filter disposed after the semiconductor chip, the semiconductor chip containing at least one III-V semiconductor material and the optical filter absorbing radiation of a wavelength that is greater than the wavelength λ0 of the sensitivity maximum.
Public/Granted literature
- US20070040101A1 Radiation detector Public/Granted day:2007-02-22
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