Invention Grant
US07709779B2 Method and apparatus for detecting an optical reflection indicative of a photodiode
有权
用于检测指示光电二极管的光反射的方法和装置
- Patent Title: Method and apparatus for detecting an optical reflection indicative of a photodiode
- Patent Title (中): 用于检测指示光电二极管的光反射的方法和装置
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Application No.: US11870781Application Date: 2007-10-11
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Publication No.: US07709779B2Publication Date: 2010-05-04
- Inventor: Harold E. Hager
- Applicant: Harold E. Hager
- Applicant Address: US IL Chicago
- Assignee: The Boeing Company
- Current Assignee: The Boeing Company
- Current Assignee Address: US IL Chicago
- Agency: Yee & Associates, P.C.
- Agent Kevin G. Fields
- Main IPC: H01L31/00
- IPC: H01L31/00 ; G01J3/50
Abstract:
A system and methods for detecting semiconductor-based photodiodes. The present embodiments provide a simple and practical approach for identifying optical reflection that is indicative of photon reflection from semiconductor-based photodiodes. Thus in certain applications the present embodiments may be used to detect the presence of OIEDs, which may use photodiodes as part of a detonation system.
Public/Granted literature
- US20090095885A1 SYSTEM AND METHODS FOR DETECTING SEMICONDUCTOR-BASED PHOTODIODES Public/Granted day:2009-04-16
Information query
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