Invention Grant
- Patent Title: High-voltage MOS transistor device
- Patent Title (中): 高压MOS晶体管器件
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Application No.: US11836785Application Date: 2007-08-10
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Publication No.: US07709908B2Publication Date: 2010-05-04
- Inventor: Chao-Yuan Su , Wei-Lun Hsu , Ching-Ming Lee , Chih-Jen Huang , Te-Yuan Wu , Chun-Hsiung Peng
- Applicant: Chao-Yuan Su , Wei-Lun Hsu , Ching-Ming Lee , Chih-Jen Huang , Te-Yuan Wu , Chun-Hsiung Peng
- Applicant Address: TW Hsin-Chu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Hsin-Chu
- Agent Wintson Hsu
- Main IPC: H01L29/78
- IPC: H01L29/78

Abstract:
A high-voltage transistor device has a substrate, an isolation structure, a source, a gate, a drain, a plurality of doped regions, a plurality of ion wells, and a first dielectric layer disposed on the substrate. The high-voltage transistor device further has a first conductive layer and a plurality of first field plate rings. The first conductive layer is electrically connected to the drain and at least one of the first field plate rings.
Public/Granted literature
- US20090039424A1 HIGH-VOLTAGE MOS TRANSISTOR DEVICE Public/Granted day:2009-02-12
Information query
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