Invention Grant
- Patent Title: Complementary metal oxide semiconductor image sensor
- Patent Title (中): 互补金属氧化物半导体图像传感器
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Application No.: US11162118Application Date: 2005-08-29
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Publication No.: US07755122B2Publication Date: 2010-07-13
- Inventor: Chiu-Te Lee
- Applicant: Chiu-Te Lee
- Applicant Address: TW Hsinchu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Main IPC: H01L29/78
- IPC: H01L29/78

Abstract:
A CMOS image sensor including a light-receiving element, at least one transistor, a first dielectric layer, a reflective layer, a second dielectric layer, a protective layer, a material layer, a transparent material layer, an optical filter, and a converging element is described. The light-receiving element and the transistor are disposed respectively inside the light sensing region and the transistor region. The first dielectric layer is disposed on the substrate, covering the transistor and the light-receiving element. The reflective layer is disposed on the first dielectric layer inside the light sensing region. The second dielectric layer is disposed on the first dielectric layer outside of the reflective layer. The material layer is disposed on the first dielectric layer inside of the reflective layer. The optical filter is disposed on the transparent material layer and the converging element is disposed on the optical filter inside the light sensing region.
Public/Granted literature
- US20070052053A1 COMPLEMENTARY METAL OXIDE SEMICONDUCTOR IMAGE SENSOR AND FABRICATING METHOD THEREOF Public/Granted day:2007-03-08
Information query
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