Invention Grant
- Patent Title: Device for and method of inspecting surface condition having different curvatures
- Patent Title (中): 检查具有不同曲率的表面状况的装置和方法
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Application No.: US11707293Application Date: 2007-02-14
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Publication No.: US07782451B2Publication Date: 2010-08-24
- Inventor: Toshihiko Matsumoto , Hiroshi Okabe , Takashi Kinoshita , Yoshihiro Kanetani
- Applicant: Toshihiko Matsumoto , Hiroshi Okabe , Takashi Kinoshita , Yoshihiro Kanetani
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A target surface of a target object including portions having different curvatures is inspected by using an illuminating device and a camera that are fixed, a supporting device for supporting the target object such that its position and orientation are variable. The position and orientation of the target object are controlled as its image is obtained for a plurality of times. The position and orientation of the target object are controlled such that the image of any point on the target surface will be included in at least one of the images obtained by the camera.
Public/Granted literature
- US20070211240A1 Device for and method of inspecting surface condition Public/Granted day:2007-09-13
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