Invention Grant
- Patent Title: Universal multidetection system for microplates
- Patent Title (中): 微孔板通用多检测系统
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Application No.: US11802831Application Date: 2007-05-25
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Publication No.: US07782454B2Publication Date: 2010-08-24
- Inventor: Oleg Zimenkov , Xavier Amouretti , Robert M. Gifford , Mark R. Kennedy , Michael Kontorovich , Ben Norris , Richard N. Sears , Dan Venditti , Christopher Many
- Applicant: Oleg Zimenkov , Xavier Amouretti , Robert M. Gifford , Mark R. Kennedy , Michael Kontorovich , Ben Norris , Richard N. Sears , Dan Venditti , Christopher Many
- Applicant Address: US VT Winooski
- Assignee: BTI Holdings, Inc.
- Current Assignee: BTI Holdings, Inc.
- Current Assignee Address: US VT Winooski
- Agency: Sughrue Mion, PLLC
- Main IPC: G01J3/44
- IPC: G01J3/44

Abstract:
An apparatus and a method for optically analyzing a sample are provided. The apparatus includes a first optical device that transmits a narrow waveband of light and has a first filter and a first monochromator that provide different paths for the narrow waveband of the light. The apparatus may also include a light source that generates the light as broadband excitation light, in which case the first optical device transmits a narrow waveband of the broadband excitation light through the first filter or the first monochromator. Further, the apparatus may include a second optical device that directs the narrow waveband of the broadband excitation light onto the sample and receives emission light from the sample, a third optical device that transmits a narrow waveband of the emission light, and a detector that converts the narrow waveband of the emission light into an electrical signal.
Public/Granted literature
- US20080191149A1 Universal multidetection system for microplates Public/Granted day:2008-08-14
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