A method of automatically producing layout information includes receiving first layout information of an integrated circuit; when receiving the first layout information, activating an automated process mechanism to stores the first layout information into a reference database; reading the first layout information from the reference database by the automated process mechanism; and analyzing the first layout information to obtain second layout information by the automated process mechanism. In an exemplary embodiment, the method of the present invention further includes validating accuracy of the first layout information according to the second layout information.